Use this URL to cite or link to this record in EThOS: http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.280347
Title: Strain evaluation in III-V semiconductor compounds from measurement of thickness fringe displacements.
Author: Harvey, Alan John.
Awarding Body: University of Surrey
Current Institution: University of Surrey
Date of Award: 1990
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Abstract:
No abstract available
Supervisor: Not available Sponsor: Not available
Qualification Name: Thesis (Ph.D.) Qualification Level: Doctoral
EThOS ID: uk.bl.ethos.280347  DOI: Not available
Keywords: Solid-state physics Solid state physics
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