Use this URL to cite or link to this record in EThOS: http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.279473
Title: Characterisation of deep-levels in silicon for applications in thermal imaging
Author: Parker, G. J.
Awarding Body: University of Surrey
Current Institution: University of Surrey
Date of Award: 1982
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Abstract:
No abstract available
Supervisor: Not available Sponsor: Not available
Qualification Name: Thesis (Ph.D.) Qualification Level: Doctoral
EThOS ID: uk.bl.ethos.279473  DOI: Not available
Keywords: Physics, general Physics
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