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Title: Reliable operation and recovery of self-checking sequential circuits.
Author: Wahieb, Bahir Mahmoud.
ISNI:       0000 0001 3550 4709
Awarding Body: Cranfield Institute of Technology
Current Institution: Cranfield University
Date of Award: 1990
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No abstract available
Supervisor: Not available Sponsor: Not available
Qualification Name: Thesis (Ph.D.) Qualification Level: Doctoral
EThOS ID:  DOI: Not available
Keywords: Circuit operation reliability Electric circuits Electronic circuits Reliability (Engineering)