Use this URL to cite or link to this record in EThOS: http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.254219
Title: A structural study of the Si(001) using high resolution helium atom diffraction.
Author: Rohlfing, David Michael.
Awarding Body: University of Cambridge
Current Institution: University of Cambridge
Date of Award: 1987
Availability of Full Text:
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Abstract:
No abstract available
Supervisor: Not available Sponsor: Not available
Qualification Name: Thesis (Ph.D.) Qualification Level: Doctoral
EThOS ID: uk.bl.ethos.254219  DOI: Not available
Keywords: Silicon surface analysis Solid state physics
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