Use this URL to cite or link to this record in EThOS:
Title: High resolution electron energy loss spectroscopy of narrow gap III V semiconductor surfaces and interfaces
Author: Veal, Timothy David.
Awarding Body: University of Warwick
Current Institution: University of Warwick
Date of Award: 2002
Availability of Full Text:
Access through EThOS:
No abstract available
Supervisor: Not available Sponsor: Not available
Qualification Name: Thesis (Ph.D.) Qualification Level: Doctoral
EThOS ID:  DOI: Not available
Keywords: Solid-state physics Solid state physics Plasma (Ionized gases) Atoms Molecules