Use this URL to cite or link to this record in EThOS: http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.251349
Title: A TEM study of strained SiGe/Si and related heteroepitaxial structures
Author: Benedetti, Alessandro.
ISNI:       0000 0000 6814 3439
Awarding Body: University of Sheffield
Current Institution: University of Sheffield
Date of Award: 2002
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Abstract:
No abstract available
Supervisor: Not available Sponsor: Not available
Qualification Name: Thesis (Ph.D.) Qualification Level: Doctoral
EThOS ID: uk.bl.ethos.251349  DOI: Not available
Keywords: Semiconductor devices Solid state physics Electric apparatus and appliances Electronic apparatus and appliances
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