Use this URL to cite or link to this record in EThOS:
Title: Extended defects in SiGe device structures formed by ion implantation.
Author: Christiano, Filadelfo.
ISNI:       0000 0001 3549 1194
Awarding Body: University of Surrey
Current Institution: University of Surrey
Date of Award: 1998
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No abstract available
Supervisor: Not available Sponsor: Not available
Qualification Name: Thesis (Ph.D.) Qualification Level: Doctoral
EThOS ID:  DOI: Not available
Keywords: Heterostructures; Solid Phase Epitaxial Growth