Use this URL to cite or link to this record in EThOS: http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.236067
Title: The density of gap states in magnetron sputtered hydrogenated amorphous silicon.
Author: Chahdi, Mohammed.
ISNI:       0000 0001 3525 915X
Awarding Body: University of Glasgow
Current Institution: University of Glasgow
Date of Award: 1986
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Abstract:
No abstract available
Supervisor: Not available Sponsor: Not available
Qualification Name: Thesis (Ph.D.) Qualification Level: Doctoral
EThOS ID: uk.bl.ethos.236067  DOI: Not available
Keywords: Semiconductor physics
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